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22 relations: Atom, Auger electron spectroscopy, Bismuth, Caesium, Chemical structure, Electron ionization, Femto-, Gallium, Ion beam, Liquid metal ion source, Mass spectrometry, Mass spectrum, Noble gas, Polytetrafluoroethylene, Quadrupole mass analyzer, Secondary ion mass spectrometry, Surface tension, Thermal ionization, Time-of-flight mass spectrometry, Tungsten, Ultra-high vacuum, University of Münster.
Atom
An atom is the smallest constituent unit of ordinary matter that has the properties of a chemical element.
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Auger electron spectroscopy
Hanford scientist uses an Auger electron spectrometer to determine the elemental composition of surfaces. Auger electron spectroscopy (AES; pronounced in French) is a common analytical technique used specifically in the study of surfaces and, more generally, in the area of materials science.
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Bismuth
Bismuth is a chemical element with symbol Bi and atomic number 83.
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Caesium
Caesium (British spelling and IUPAC spelling) or cesium (American spelling) is a chemical element with symbol Cs and atomic number 55.
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Chemical structure
A chemical structure determination includes a chemist's specifying the molecular geometry and, when feasible and necessary, the electronic structure of the target molecule or other solid.
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Electron ionization
Electron ionization (EI, formerly known as electron impact ionization and electron bombardment ionization) is an ionization method in which energetic electrons interact with solid or gas phase atoms or molecules to produce ions.
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Femto-
Femto- (symbol f) is a unit prefix in the metric system denoting a factor of 10−15 or.
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Gallium
Gallium is a chemical element with symbol Ga and atomic number 31.
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Ion beam
An ion beam is a type of charged particle beam consisting of ions.
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Liquid metal ion source
A liquid metal ion source (LMIS) is an ion source which uses metal that is heated to the liquid state and used to form an electrospray to form ions.
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Mass spectrometry
Mass spectrometry (MS) is an analytical technique that ionizes chemical species and sorts the ions based on their mass-to-charge ratio.
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Mass spectrum
A mass spectrum is an intensity vs.
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Noble gas
The noble gases (historically also the inert gases) make up a group of chemical elements with similar properties; under standard conditions, they are all odorless, colorless, monatomic gases with very low chemical reactivity.
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Polytetrafluoroethylene
Polytetrafluoroethylene (PTFE) is a synthetic fluoropolymer of tetrafluoroethylene that has numerous applications.
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Quadrupole mass analyzer
The quadrupole mass analyzer (QMS) is one type of mass analyzer used in mass spectrometry.
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Secondary ion mass spectrometry
Secondary-ion mass spectrometry (SIMS) is a technique used to analyze the composition of solid surfaces and thin films by sputtering the surface of the specimen with a focused primary ion beam and collecting and analyzing ejected secondary ions.
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Surface tension
Surface tension is the elastic tendency of a fluid surface which makes it acquire the least surface area possible.
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Thermal ionization
Thermal ionization, also known as surface ionization or contact ionization, is a physical process whereby the atoms are desorbed from a hot surface, and in the process are spontaneously ionized.
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Time-of-flight mass spectrometry
Time-of-flight mass spectrometry (TOFMS) is a method of mass spectrometry in which an ion's mass-to-charge ratio is determined via a time of flight measurement.
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Tungsten
Tungsten, or wolfram, is a chemical element with symbol W (referring to wolfram) and atomic number 74.
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Ultra-high vacuum
Ultra-high vacuum (UHV) is the vacuum regime characterised by pressures lower than about 10−7 pascal or 100 nanopascals (10−9 mbar, ~10−9 torr).
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University of Münster
The University of Münster (Westfälische Wilhelms-Universität Münster, WWU) is a public university located in the city of Münster, North Rhine-Westphalia in Germany.
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STATIC SIMS, Static SIMS, Static secondary ion mass spectrometry.
References
[1] https://en.wikipedia.org/wiki/Static_secondary-ion_mass_spectrometry
