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Electron spectrometer

Index Electron spectrometer

In an electron spectrometer, an incoming beam of electrons is bent with electric or magnetic fields. [1]

15 relations: Astigmatism (optical systems), Effective potential, Electron energy loss spectroscopy, Electron gun, Energy filtered transmission electron microscopy, Helmholtz coil, Mass spectrometry, Particle accelerator, Photoelectric effect, Photoemission electron microscopy, Space telescope, Spherical aberration, Spin polarization, Time-of-flight mass spectrometry, Transmission electron microscopy.

Astigmatism (optical systems)

An optical system with astigmatism is one where rays that propagate in two perpendicular planes have different foci.

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Effective potential

The effective potential (also known as effective potential energy) combines multiple, perhaps opposing, effects into a single potential.

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Electron energy loss spectroscopy

In electron energy loss spectroscopy (EELS) a material is exposed to a beam of electrons with a known, narrow range of kinetic energies.

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Electron gun

An electron gun (also called electron emitter) is an electrical component in some vacuum tubes that produces a narrow, collimated electron beam that has a precise kinetic energy.

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Energy filtered transmission electron microscopy

Energy-filtered transmission electron microscopy (EFTEM) is a technique used in transmission electron microscopy, in which only electrons of particular kinetic energies are used to form the image or diffraction pattern.

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Helmholtz coil

A Helmholtz coil is a device for producing a region of nearly uniform magnetic field, named after the German physicist Hermann von Helmholtz.

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Mass spectrometry

Mass spectrometry (MS) is an analytical technique that ionizes chemical species and sorts the ions based on their mass-to-charge ratio.

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Particle accelerator

A particle accelerator is a machine that uses electromagnetic fields to propel charged particles to nearly light speed and to contain them in well-defined beams.

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Photoelectric effect

The photoelectric effect is the emission of electrons or other free carriers when light shines on a material.

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Photoemission electron microscopy

Photoemission Electron microscopy (PEEM, also called photoelectron microscopy, PEM) is a widely used type of emission microscopy.

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Space telescope

A space telescope or space observatory is an instrument located in outer space to observe distant planets, galaxies and other astronomical objects.

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Spherical aberration

Spherical aberration is an optical effect observed in an optical device (lens, mirror, etc.) that occurs due to the increased refraction of light rays when they strike a lens or a reflection of light rays when they strike a mirror near its edge, in comparison with those that strike close to the centre.

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Spin polarization

Spin polarization is the degree to which the spin, i.e., the intrinsic angular momentum of elementary particles, is aligned with a given direction.

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Time-of-flight mass spectrometry

Time-of-flight mass spectrometry (TOFMS) is a method of mass spectrometry in which an ion's mass-to-charge ratio is determined via a time of flight measurement.

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Transmission electron microscopy

Transmission electron microscopy (TEM, also sometimes conventional transmission electron microscopy or CTEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image.

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[1] https://en.wikipedia.org/wiki/Electron_spectrometer

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