46 relations: Atom, Auger effect, Auger electron spectroscopy, Binding energy, Cadmium telluride, Cadmium zinc telluride, Calorimeter, Characterization (materials science), Crystal structure, Diffraction, Electron, Electron hole, Electron microprobe, Electron microscope, Electron shell, Elemental analysis, Emission spectrum, Ground state, Heat capacity, High energy X-ray imaging technology, Kinetic energy, Liquid nitrogen, Microphonics, Optical resolution, Particle-induced X-ray emission, Proton, Sample (material), Scanning electron microscope, Scanning transmission electron microscopy, Silicon drift detector, Spectroscopy, Spectrum, Stopping power (particle radiation), Thermoelectric cooling, Thermometer, Time constant, Transition-edge sensor, Transmission electron microscopy, Voltage, Wavelength-dispersive X-ray spectroscopy, X-ray, X-ray detector, X-ray fluorescence, X-ray generator, X-ray microtomography, X-ray photoelectron spectroscopy.
An atom is the smallest constituent unit of ordinary matter that has the properties of a chemical element.
The Auger effect is a physical phenomenon in which the filling of an inner-shell vacancy of an atom is accompanied by the emission of an electron from the same atom.
Hanford scientist uses an Auger electron spectrometer to determine the elemental composition of surfaces. Auger electron spectroscopy (AES; pronounced in French) is a common analytical technique used specifically in the study of surfaces and, more generally, in the area of materials science.
Binding energy (also called separation energy) is the minimum energy required to disassemble a system of particles into separate parts.
Cadmium telluride (CdTe) is a stable crystalline compound formed from cadmium and tellurium.
Cadmium zinc telluride, (CdZnTe) or CZT, is a compound of cadmium, zinc and tellurium or, more strictly speaking, an alloy of cadmium telluride and zinc telluride.
A calorimeter is an object used for calorimetry, or the process of measuring the heat of chemical reactions or physical changes as well as heat capacity.
Characterization, when used in materials science, refers to the broad and general process by which a material's structure and properties are probed and measured.
In crystallography, crystal structure is a description of the ordered arrangement of atoms, ions or molecules in a crystalline material.
--> Diffraction refers to various phenomena that occur when a wave encounters an obstacle or a slit.
The electron is a subatomic particle, symbol or, whose electric charge is negative one elementary charge.
In physics, chemistry, and electronic engineering, an electron hole (often simply called a hole) is the lack of an electron at a position where one could exist in an atom or atomic lattice.
An electron microprobe (EMP), also known as an electron probe microanalyzer (EPMA) or electron micro probe analyzer (EMPA), is an analytical tool used to non-destructively determine the chemical composition of small volumes of solid materials.
An electron microscope is a microscope that uses a beam of accelerated electrons as a source of illumination.
In chemistry and atomic physics, an electron shell, or a principal energy level, may be thought of as an orbit followed by electrons around an atom's nucleus.
Elemental analysis is a process where a sample of some material (e.g., soil, waste or drinking water, bodily fluids, minerals, chemical compounds) is analyzed for its elemental and sometimes isotopic composition.
The emission spectrum of a chemical element or chemical compound is the spectrum of frequencies of electromagnetic radiation emitted due to an atom or molecule making a transition from a high energy state to a lower energy state.
The ground state of a quantum mechanical system is its lowest-energy state; the energy of the ground state is known as the zero-point energy of the system.
Heat capacity or thermal capacity is a measurable physical quantity equal to the ratio of the heat added to (or removed from) an object to the resulting temperature change.
High energy X-ray imaging technology (HEXITEC) is a family of spectroscopic, single photon counting, pixel detectors developed for high energy X-ray and Ύ-ray spectroscopy applications.
In physics, the kinetic energy of an object is the energy that it possesses due to its motion.
Liquid nitrogen is nitrogen in a liquid state at an extremely low temperature.
Microphonics or microphony describes the phenomenon wherein certain components in electronic devices transform mechanical vibrations into an undesired electrical signal (noise).
Optical resolution describes the ability of an imaging system to resolve detail in the object that is being imaged.
Particle-induced X-ray emission or proton-induced X-ray emission (PIXE) is a technique used in the determining of the elemental make-up of a material or sample.
In general, a sample is a limited quantity of something which is intended to be similar to and represent a larger amount of that thing(s).
A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons.
A scanning transmission electron microscope (STEM) is a type of transmission electron microscope (TEM).
Silicon drift detectors (SDDs) are X-ray radiation detectors used in x-ray spectrometry (XRF and EDS) and electron microscopy.
Spectroscopy is the study of the interaction between matter and electromagnetic radiation.
A spectrum (plural spectra or spectrums) is a condition that is not limited to a specific set of values but can vary, without steps, across a continuum.
Stopping power in nuclear physics is defined as the retarding force acting on charged particles, typically alpha and beta particles, due to interaction with matter, resulting in loss of particle energy.
Thermoelectric cooling uses the Peltier effect to create a heat flux between the junction of two different types of materials.
A thermometer is a device that measures temperature or a temperature gradient.
In physics and engineering, the time constant, usually denoted by the Greek letter τ (tau), is the parameter characterizing the response to a step input of a first-order, linear time-invariant (LTI) system.
A transition-edge sensor or TES is a type of cryogenic energy sensor or cryogenic particle detector that exploits the strongly temperature-dependent resistance of the superconducting phase transition.
Transmission electron microscopy (TEM, also sometimes conventional transmission electron microscopy or CTEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image.
Voltage, electric potential difference, electric pressure or electric tension (formally denoted or, but more often simply as V or U, for instance in the context of Ohm's or Kirchhoff's circuit laws) is the difference in electric potential between two points.
Wavelength-dispersive X-ray spectroscopy (WDXS or WDS) is a method used to count the number of X-rays of a specific wavelength diffracted by a crystal.
X-rays make up X-radiation, a form of electromagnetic radiation.
X-ray detectors are devices used to measure the flux, spatial distribution, spectrum, and/or other properties of X-rays.
X-ray fluorescence (XRF) is the emission of characteristic "secondary" (or fluorescent) X-rays from a material that has been excited by bombarding with high-energy X-rays or gamma rays.
An X-ray generator is a device that produces X-rays.
X-ray microtomography, like tomography and x-ray computed tomography, uses x-rays to create cross-sections of a physical object that can be used to recreate a virtual model (3D model) without destroying the original object.
X-ray photoelectron spectroscopy (XPS) is a surface-sensitive quantitative spectroscopic technique that measures the elemental composition at the parts per thousand range, empirical formula, chemical state and electronic state of the elements that exist within a material.
EDXA, EDXMA, EDXRF, Energy Dispersive Spectroscopy, Energy Dispersive X-ray Analysis, Energy Dispersive X-ray Spectroscopy, Energy dispersive X-ray spectrometer, Energy dispersive X-ray spectroscopy, Energy-dispersive X‑ray spectroscopy, Energy-dispersive analysis of x-rays, SEM-EDX, Semedx, XEDS.