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Fluorescence interference contrast microscopy

Index Fluorescence interference contrast microscopy

Fluorescence interference contrast (FLIC) microscopy is a microscopic technique developed to achieve z-resolution on the nanometer scale. [1]

26 relations: Cartesian coordinate system, Cell membrane, Charge-coupled device, Coherence (physics), Curve fitting, Dipole, Electric field, Ellipsometry, Errors and residuals, Fluorescence, Fresnel diffraction, Intensity (physics), Lipid bilayer, Microscopy, Numerical aperture, Observational error, Optical resolution, Photolithography, Polar coordinate system, Polarization (waves), Protein, Refractive index, Silicon, Silicon dioxide, Snell's law, Wave interference.

Cartesian coordinate system

A Cartesian coordinate system is a coordinate system that specifies each point uniquely in a plane by a pair of numerical coordinates, which are the signed distances to the point from two fixed perpendicular directed lines, measured in the same unit of length.

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Cell membrane

The cell membrane (also known as the plasma membrane or cytoplasmic membrane, and historically referred to as the plasmalemma) is a biological membrane that separates the interior of all cells from the outside environment (the extracellular space).

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Charge-coupled device

A charge-coupled device (CCD) is a device for the movement of electrical charge, usually from within the device to an area where the charge can be manipulated, for example conversion into a digital value.

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Coherence (physics)

In physics, two wave sources are perfectly coherent if they have a constant phase difference and the same frequency, and the same waveform.

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Curve fitting

Curve fitting is the process of constructing a curve, or mathematical function, that has the best fit to a series of data points, possibly subject to constraints.

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Dipole

In electromagnetism, there are two kinds of dipoles.

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Electric field

An electric field is a vector field surrounding an electric charge that exerts force on other charges, attracting or repelling them.

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Ellipsometry

Ellipsometry is an optical technique for investigating the dielectric properties (complex refractive index or dielectric function) of thin films.

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Errors and residuals

In statistics and optimization, errors and residuals are two closely related and easily confused measures of the deviation of an observed value of an element of a statistical sample from its "theoretical value".

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Fluorescence

Fluorescence is the emission of light by a substance that has absorbed light or other electromagnetic radiation.

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Fresnel diffraction

In optics, the Fresnel diffraction equation for near-field diffraction is an approximation of the Kirchhoff–Fresnel diffraction that can be applied to the propagation of waves in the near field.

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Intensity (physics)

In physics, intensity is the power transferred per unit area, where the area is measured on the plane perpendicular to the direction of propagation of the energy.

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Lipid bilayer

The lipid bilayer (or phospholipid bilayer) is a thin polar membrane made of two layers of lipid molecules.

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Microscopy

Microscopy is the technical field of using microscopes to view objects and areas of objects that cannot be seen with the naked eye (objects that are not within the resolution range of the normal eye).

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Numerical aperture

In optics, the numerical aperture (NA) of an optical system is a dimensionless number that characterizes the range of angles over which the system can accept or emit light.

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Observational error

Observational error (or measurement error) is the difference between a measured value of a quantity and its true value.

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Optical resolution

Optical resolution describes the ability of an imaging system to resolve detail in the object that is being imaged.

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Photolithography

Photolithography, also termed optical lithography or UV lithography, is a process used in microfabrication to pattern parts of a thin film or the bulk of a substrate.

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Polar coordinate system

In mathematics, the polar coordinate system is a two-dimensional coordinate system in which each point on a plane is determined by a distance from a reference point and an angle from a reference direction.

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Polarization (waves)

Polarization (also polarisation) is a property applying to transverse waves that specifies the geometrical orientation of the oscillations.

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Protein

Proteins are large biomolecules, or macromolecules, consisting of one or more long chains of amino acid residues.

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Refractive index

In optics, the refractive index or index of refraction of a material is a dimensionless number that describes how light propagates through that medium.

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Silicon

Silicon is a chemical element with symbol Si and atomic number 14.

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Silicon dioxide

Silicon dioxide, also known as silica (from the Latin silex), is an oxide of silicon with the chemical formula, most commonly found in nature as quartz and in various living organisms.

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Snell's law

Snell's law (also known as Snell–Descartes law and the law of refraction) is a formula used to describe the relationship between the angles of incidence and refraction, when referring to light or other waves passing through a boundary between two different isotropic media, such as water, glass, or air.

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Wave interference

In physics, interference is a phenomenon in which two waves superpose to form a resultant wave of greater, lower, or the same amplitude.

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References

[1] https://en.wikipedia.org/wiki/Fluorescence_interference_contrast_microscopy

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