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# Inelastic electron tunneling spectroscopy

Inelastic electron tunneling spectroscopy (IETS) is an experimental tool for studying the vibrations of molecular adsorbates on metal oxides. [1]

## Biasing

Biasing in electronics means establishing predetermined voltages or currents at various points of an electronic circuit for the purpose of establishing proper operating conditions in electronic components.

## Classical Heisenberg model

The Classical Heisenberg model is the n.

## Density of states

In solid-state and condensed matter physics, the density of states (DOS) of a system describes the number of states per interval of energy at each energy level available to be occupied.

## Derivative

The derivative of a function of a real variable measures the sensitivity to change of the function value (output value) with respect to a change in its argument (input value).

## Don Eigler

Donald M. "Don" Eigler is an American physicist associated with the IBM Almaden Research Center, who is noted for his achievements in nanotechnology.

## Fermi energy

The Fermi energy is a concept in quantum mechanics usually referring to the energy difference between the highest and lowest occupied single-particle states in a quantum system of non-interacting fermions at absolute zero temperature.

## Image resolution

Image resolution is the detail an image holds.

## Infrared spectroscopy

Infrared spectroscopy (IR spectroscopy or vibrational spectroscopy) involves the interaction of infrared radiation with matter.

## Picometre

The picometre (international spelling as used by the International Bureau of Weights and Measures; SI symbol: pm) or picometer (American spelling) is a unit of length in the metric system, equal to, or one trillionth of a metre, which is the SI base unit of length.

## Scanning tunneling microscope

A scanning tunneling microscope (STM) is an instrument for imaging surfaces at the atomic level.

## Scanning tunneling spectroscopy

Scanning tunneling spectroscopy (STS), an extension of scanning tunneling microscopy (STM), is used to provide information about the density of electrons in a sample as a function of their energy.

## References

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