11 relations: Biasing, Classical Heisenberg model, Density of states, Derivative, Don Eigler, Fermi energy, Image resolution, Infrared spectroscopy, Picometre, Scanning tunneling microscope, Scanning tunneling spectroscopy.

## Biasing

Biasing in electronics means establishing predetermined voltages or currents at various points of an electronic circuit for the purpose of establishing proper operating conditions in electronic components.

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## Classical Heisenberg model

The Classical Heisenberg model is the n.

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## Density of states

In solid-state and condensed matter physics, the density of states (DOS) of a system describes the number of states per interval of energy at each energy level available to be occupied.

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## Derivative

The derivative of a function of a real variable measures the sensitivity to change of the function value (output value) with respect to a change in its argument (input value).

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## Don Eigler

Donald M. "Don" Eigler is an American physicist associated with the IBM Almaden Research Center, who is noted for his achievements in nanotechnology.

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## Fermi energy

The Fermi energy is a concept in quantum mechanics usually referring to the energy difference between the highest and lowest occupied single-particle states in a quantum system of non-interacting fermions at absolute zero temperature.

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## Image resolution

Image resolution is the detail an image holds.

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## Infrared spectroscopy

Infrared spectroscopy (IR spectroscopy or vibrational spectroscopy) involves the interaction of infrared radiation with matter.

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## Picometre

The picometre (international spelling as used by the International Bureau of Weights and Measures; SI symbol: pm) or picometer (American spelling) is a unit of length in the metric system, equal to, or one trillionth of a metre, which is the SI base unit of length.

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## Scanning tunneling microscope

A scanning tunneling microscope (STM) is an instrument for imaging surfaces at the atomic level.

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## Scanning tunneling spectroscopy

Scanning tunneling spectroscopy (STS), an extension of scanning tunneling microscopy (STM), is used to provide information about the density of electrons in a sample as a function of their energy.

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## Redirects here:

IETS, Inelastic electron tunnelling spectroscopy.

## References

[1] https://en.wikipedia.org/wiki/Inelastic_electron_tunneling_spectroscopy