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MEMS for in situ mechanical characterization

Index MEMS for in situ mechanical characterization

MEMS (microelectromechanical systems) for in situ mechanical characterization refers to microfabricated systems (lab-on-a-chip) used to measure the mechanical properties (Young’s modulus, fracture strength) of nanoscale specimens such as nanowires, nanorods, whiskers, nanotubes and thin films. [1]

19 relations: Atomic force microscopy, Diffraction, Fracture, Johns Hopkins University, Lab-on-a-chip, Microelectromechanical systems, Microfabrication, Microscope, Microsystem, Nanorod, Nanoscopic scale, Nanowire, Northwestern University, Scanning electron microscope, Spectroscopy, Thin film, Transmission electron microscopy, Universal testing machine, Young's modulus.

Atomic force microscopy

Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

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Diffraction

--> Diffraction refers to various phenomena that occur when a wave encounters an obstacle or a slit.

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Fracture

A fracture is the separation of an object or material into two or more pieces under the action of stress.

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Johns Hopkins University

Johns Hopkins University is an American private research university in Baltimore, Maryland.

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Lab-on-a-chip

A lab-on-a-chip (LOC) is a device that integrates one or several laboratory functions on a single integrated circuit (commonly called a "chip") of only millimeters to a few square centimeters to achieve automation and high-throughput screening.

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Microelectromechanical systems

Microelectromechanical systems (MEMS, also written as micro-electro-mechanical, MicroElectroMechanical or microelectronic and microelectromechanical systems and the related micromechatronics) is the technology of microscopic devices, particularly those with moving parts.

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Microfabrication

Microfabrication is the process of fabricating miniature structures of micrometre scales and smaller.

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Microscope

A microscope (from the μικρός, mikrós, "small" and σκοπεῖν, skopeîn, "to look" or "see") is an instrument used to see objects that are too small to be seen by the naked eye.

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Microsystem

Microsystem is the name commonly used in Europe to describe the same technology which goes under the name MEMS (Micro Electro Mechanical Systems) in the US.

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Nanorod

In nanotechnology, nanorods are one morphology of nanoscale objects.

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Nanoscopic scale

The nanoscopic scale (or nanoscale) usually refers to structures with a length scale applicable to nanotechnology, usually cited as 1–100 nanometers.

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Nanowire

A nanowire is a nanostructure, with the diameter of the order of a nanometer (10−9 meters).

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Northwestern University

Northwestern University (NU) is a private research university based in Evanston, Illinois, United States, with other campuses located in Chicago and Doha, Qatar, and academic programs and facilities in Miami, Florida, Washington, D.C., and San Francisco, California.

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Scanning electron microscope

A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons.

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Spectroscopy

Spectroscopy is the study of the interaction between matter and electromagnetic radiation.

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Thin film

A thin film is a layer of material ranging from fractions of a nanometer (monolayer) to several micrometers in thickness.

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Transmission electron microscopy

Transmission electron microscopy (TEM, also sometimes conventional transmission electron microscopy or CTEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image.

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Universal testing machine

A universal testing machine (UTM), also known as a universal tester, materials testing machine or materials test frame, is used to test the tensile strength and compressive strength of materials.

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Young's modulus

Young's modulus, also known as the elastic modulus, is a measure of the stiffness of a solid material.

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Redirects here:

MEMS for In-situ Mechanical Characterization, MEMS for in-situ mechanical characterization.

References

[1] https://en.wikipedia.org/wiki/MEMS_for_in_situ_mechanical_characterization

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