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64 relations: Abbreviated Test Language for All Systems, Advantest, Alex d'Arbeloff, Analog signature analysis, Ate, ATML, Automated tissue image analysis, Automatic test pattern generation, Capital good, Chroma ATE, Circuit Check, Computational RAM, Credence Systems, Design for testing, Device under test, DUT board, Eagle Test Systems, Electronic test equipment, Elta Systems, Fairchild Semiconductor, Flying probe, General Radio, George Chamillard, Handler, HP 2100, IEEE-488, Indra Sistemas, Laser trimming, List of acquisitions by Hewlett-Packard, List of file formats, List of United States Marine Corps MOS, Logic built-in self-test, LTX, Marconi Instruments, Memory tester, National Instruments, Nick DeWolf, Non-contact wafer testing, PCI eXtensions for Instrumentation, PDP-11, Pickering Interfaces, Pogo pin, Probe card, Reed relay, Rocky Mountain BASIC, Roos Instruments, Shmoo plot, Source measure unit, SPEA (company), Standard Commands for Programmable Instruments, ..., Standard Test Data Format, System testing, Teradyne, Test engineer, Test equipment, Test probe, Trillium (disambiguation), Umtech, Universal Test Specification Language, V850, Verigy, VTI Instruments, Waveform viewer, 5DX. Expand index (14 more) »
Abbreviated Test Language for All Systems
Abbreviated Test Language for All Systems (ATLAS) is a MILSPEC language for automatic testing of avionics equipment.
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Advantest
is a leading manufacturer of automatic test equipment (ATE) for the semiconductor industry, and a manufacturer of measuring instruments used in the design, production and maintenance of electronic systems including fiber optic and wireless communications equipment and digital consumer products.
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Alex d'Arbeloff
Alexander Vladimir d'Arbeloff (December 21, 1927 – July 8, 2008) was the American co-founder of Teradyne, a multibillion-dollar Boston, Massachusetts-based manufacturer of automatic test equipment (ATE).
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Analog signature analysis
Analog signature analysis is electronic component and circuit board troubleshooting technique which applies a current-limited AC sinewave across two points of an electronic component or circuit.
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Ate
Ate or ATE may refer to.
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ATML
Automatic Test Markup Language (ATML) is a collection of XML schemas that allows automatic test systems (ATS) to exchange test information in a common format adhering to the XML standard.
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Automated tissue image analysis
Automated tissue image analysis is a process by which computer-controlled automatic test equipment is used to evaluate tissue samples, using computations to derive quantitative measurements from an image to avoid subjective errors.
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Automatic test pattern generation
ATPG (acronym for both Automatic Test Pattern Generation and Automatic Test Pattern Generator) is an electronic design automation method/technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects.
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Capital good
A capital good is a durable good (one that does not quickly wear out) that is used in the production of goods or services.
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Chroma ATE
Chroma ATE Inc., a Taiwan company, is an own brand supplier in electronic test and measurement equipment and systems, providing testing equipment, automatic testing equipment (ATE) and manufacturing execution systems (MES).
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Circuit Check
Circuit Check is an American company with about 225 employees and seven direct operations in six countries (the U.S., Canada, Mexico, United Kingdom, China, and Malaysia).
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Computational RAM
Computational RAM or C-RAM is random-access memory with processing elements integrated on the same chip.
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Credence Systems
Credence Systems Corporation was a manufacturer of test equipment for the global semiconductor industry, with a major focus on solving specific challenges facing the fast-growing consumer-driven semiconductor markets.
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Design for testing
Design for testing or design for testability (DFT) consists of IC design techniques that add testability features to a hardware product design.
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Device under test
A device under test (DUT), also known as equipment under test (EUT) and unit under test (UUT), is a manufactured product undergoing testing, either at first manufacture or later during its life cycle as part of ongoing functional testing and calibration checks.
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DUT board
DUT boards are used in automated integrated circuit testing where the term DUT stands for device under test, referring to the circuit being tested.
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Eagle Test Systems
Eagle Test Systems is a supplier of automatic test equipment (ATE) and operates as a business unit within the Teradyne Semiconductor Test Division.
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Electronic test equipment
Electronic test equipment is used to create signals and capture responses from electronic devices under test (DUTs).
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Elta Systems
ELTA Systems Ltd is an Israeli provider of defense products and services specializing in radar, C4ISTAR, RF, SIGINT and EW products.
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Fairchild Semiconductor
Fairchild Semiconductor International, Inc. was an American semiconductor company based in San Jose, California.
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Flying probe
In the testing of printed circuit boards, a flying probe test or fixtureless in-circuit test (FICT) system may be used for testing low to mid volume production, prototypes, and boards that present accessibility problems.
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General Radio
General Radio Company (later, GenRad) was a broad-line manufacturer of electronic test equipment.
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George Chamillard
George W. Chamillard (born 1939 in Needham, MA) is an American business executive who served as Chairman of the Board of Directors at Teradyne, a manufacturer of automatic test equipment for semiconductor devices, from 2000 to 2006.
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Handler
Handler or The Handler may refer to.
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HP 2100
The HP 2100 was a series of minicomputers produced by Hewlett-Packard (HP) from the mid-1960s to early 1990s.
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IEEE-488
IEEE 488 is a short-range digital communications 8-bit parallel multi-master interface bus specification.
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Indra Sistemas
Indra Sistemas, S.A. is a Spanish information technology and defense systems company.
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Laser trimming
Laser trimming is the manufacturing process of using a laser to adjust the operating parameters of an electronic circuit.
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List of acquisitions by Hewlett-Packard
Hewlett-Packard, commonly referred to as HP, was an information technology corporation based in Palo Alto, California, which was split into two companies: Hewlett Packard Enterprise and HP Inc.
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List of file formats
This is a list of file formats used by computers, organized by type.
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List of United States Marine Corps MOS
The United States Marine Corps Military Occupational Specialty (MOS) is a system of categorizing career fields.
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Logic built-in self-test
Logic built-in self-test (or LBIST) is a form of built-in self-test (BIST) in which hardware and/or software is built into integrated circuits allowing them to test their own operation, as opposed to reliance on external automated test equipment.
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LTX
Xcerra Corporation (formerly LTX-Credence Corporation) is a semiconductor Automatic Test Equipment (ATE) vendor, founded in 1976 and headquartered in Norwood, MA (Greater Boston area).
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Marconi Instruments
Marconi Instruments Limited (MI) was a British company, one of the Marconi group of companies, formerly part of GEC.
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Memory tester
Memory testers are specialized test equipment used to test and verify memory modules.
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National Instruments
National Instruments Corporation, or NI, is an American multinational company with international operation.
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Nick DeWolf
Nicholas DeWolf (July 12, 1928 – April 16, 2006) was co-founder of Teradyne, a Boston, Massachusetts-based manufacturer of automatic test equipment.
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Non-contact wafer testing
Wafer testing is a normal step in semiconductor device fabrication, used to detect defects in integrated circuits (IC) before they are assembled during the IC packaging step.
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PCI eXtensions for Instrumentation
PCI eXtensions for Instrumentation (PXI) is one of several modular electronic instrumentation platforms in current use.
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PDP-11
The PDP-11 is a series of 16-bit minicomputers sold by Digital Equipment Corporation (DEC) from 1970 into the 1990s, one of a succession of products in the PDP series.
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Pickering Interfaces
Pickering Interfaces is a test and measurement company headquartered in Clacton-on-Sea, United Kingdom.
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Pogo pin
A Pogo pin is a device used in electronics to establish a (usually temporary) connection between two printed circuit boards.
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Probe card
A probe card is an interface between an electronic test system and a semiconductor wafer.
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Reed relay
A reed relay is a type of relay that uses an electromagnet to control one or more reed switches.
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Rocky Mountain BASIC
Rocky Mountain BASIC (also RMB or RM-BASIC) is a dialect of the BASIC programming language created by Hewlett-Packard.
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Roos Instruments
Roos Instruments is a company based in Santa Clara, CA that designs and manufactures Automatic Test Equipment (ATE) for the semiconductor industry.
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Shmoo plot
In electrical engineering, a shmoo plot is a graphical display of the response of a component or system varying over a range of conditions or inputs.
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Source measure unit
The Source measure unit (SMU) is a type of test equipment which, as the name indicates, is capable of both sourcing and measuring at the same time.
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SPEA (company)
SPEA is an Italian company that designs and manufactures Automatic Test Equipment (ATE) for testing MEMS, Sensors, microchips and Printed circuit board.
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Standard Commands for Programmable Instruments
The Standard Commands for Programmable Instruments (SCPI; often pronounced "skippy") defines a standard for syntax and commands to use in controlling programmable test and measurement devices, such as automatic test equipment and electronic test equipment.
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Standard Test Data Format
Standard Test Data Format (STDF) is a proprietary file format for semiconductor test information originally developed by Teradyne, but it is now a de facto standard widely used throughout the semiconductor industry.
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System testing
System testing of software or hardware is testing conducted on a complete, integrated system to evaluate the system's compliance with its specified requirements.
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Teradyne
Teradyne, based in North Reading, Massachusetts in the United States, is a developer and supplier of automatic test equipment (ATE).
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Test engineer
A test engineer is a professional who determines how to create a process that would best test a particular product in manufacturing and related disciplines in order to assure that the product meets applicable specifications.
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Test equipment
Test equipment is a general term describing equipment used in many fields.
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Test probe
A test probe is a physical device used to connect electronic test equipment to a device under test (DUT).
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Trillium (disambiguation)
Trillium is a genus of flowering plants.
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Umtech
Umtech Incorporated., also known as the VideoBrain Computer Company, was an early entrant in the personal computer market that developed, manufactured, and marketed the first computer, VideoBrain, sold in department stores.
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Universal Test Specification Language
Universal Test Specification Language (UTSL) is a programming language used to describe ASIC tests in a format that leads to an automated translation of the test specification into an executable test code.
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V850
V850 is the trademark name for a 32-bit RISC CPU architecture of Renesas Electronics for embedded microcontrollers, introduced in early 90's by NEC and still being developed as of 2018.
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Verigy
Verigy Ltd is an Advantest Group company in the semiconductor automatic test equipment business.
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VTI Instruments
VTI Instruments sells precision instrumentation for electronic signal distribution, data acquisition and monitoring.
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Waveform viewer
A waveform viewer is a software tool for viewing the signal levels of either a digital or analog circuit design.
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5DX
The 5DX was an automated X-ray inspection robot, which belonged to the set of automated test equipment robots and industrial robots utilizing machine vision.
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ATE Diagnostics, ATE diagnostics, Automated test equipment, Automatic Test Equipment, Automatic Test Systems, Automatic test systems, Semiconductor test equipment.
References
[1] https://en.wikipedia.org/wiki/Automatic_test_equipment
