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Electron energy loss spectroscopy

Index Electron energy loss spectroscopy

In electron energy loss spectroscopy (EELS) a material is exposed to a beam of electrons with a known, narrow range of kinetic energies. [1]

47 relations: Aerographite, Amorphous carbon, Andrzej Wieckowski, Annular dark-field imaging, Atom, Characterization (materials science), Characterization of nanoparticles, Christian Colliex, Crystallographic defects in diamond, Debye–Waller factor, DP code, Eel (disambiguation), Electron beam-induced deposition, Electron diffraction, Electron magnetic circular dichroism, Electron microprobe, Electron microscope, Electron spectrometer, Elmar Zeitler, Energy filtered transmission electron microscopy, EXC code, High resolution electron energy loss spectroscopy, High-resolution transmission electron microscopy, Hyperspectral imaging, Kramers–Kronig relations, Lanthanum aluminate-strontium titanate interface, List of materials analysis methods, List of plasma physics articles, Microscopy Listserver, Nanometrology, Ondrej Krivanek, Peter Schattschneider, Precession electron diffraction, Radiation length, Richard D. Leapman, Scanning transmission electron microscopy, Scanning transmission X-ray microscopy, Semiconductor characterization techniques, Soquelec, Spectroscopy, Spectrum, Spin wave, Surface phonon, Surface science, Sylvia T. Ceyer, Transmission electron microscopy, YAMBO code.

Aerographite

Aerographite is a synthetic foam consisting of a porous interconnected network of tubular carbon.

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Amorphous carbon

Amorphous carbon is free, reactive carbon that does not have any crystalline structure (also called diamond-like carbon).

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Andrzej Wieckowski

Andrzej Wieckowski (Polish: Andrzej Więckowski, born February 22, 1945 in Łódź, Poland) is an Emeritus Professor of Chemistry at the University of Illinois at Urbana-Champaign and the North American Editor of Electrochimica Acta.

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Annular dark-field imaging

Annular dark-field imaging is a method of mapping samples in a scanning transmission electron microscope (STEM).

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Atom

An atom is the smallest constituent unit of ordinary matter that has the properties of a chemical element.

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Characterization (materials science)

Characterization, when used in materials science, refers to the broad and general process by which a material's structure and properties are probed and measured.

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Characterization of nanoparticles

The characterization of nanoparticles is a branch of nanometrology that deals with the characterization of physical and chemical properties of nanoparticles.

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Christian Colliex

The French physicist Christian Colliex (b. 1944) is known for his pioneering work on the use of electron energy loss spectroscopy (EELS) in transmission electron microscopy.

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Crystallographic defects in diamond

Imperfections in the crystal lattice of diamond are common.

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Debye–Waller factor

The Debye–Waller factor (DWF), named after Peter Debye and Ivar Waller, is used in condensed matter physics to describe the attenuation of x-ray scattering or coherent neutron scattering caused by thermal motion.

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DP code

DP is a free software package for physicists implementing ab initio linear-response TDDFT (time-dependent density functional theory) in frequency-reciprocal space and on a plane wave basis set.

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Eel (disambiguation)

An eel is a fish in the order of Anguilliformes.

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Electron beam-induced deposition

Electron beam-induced deposition (EBID) is a process of decomposing gaseous molecules by an electron beam leading to deposition of non-volatile fragments onto a nearby substrate.

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Electron diffraction

Electron diffraction refers to the wave nature of electrons.

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Electron magnetic circular dichroism

Electron magnetic circular dichroism (EMCD) (also known as electron energy-loss magnetic chiral dichroism) is the EELS equivalent of XMCD.

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Electron microprobe

An electron microprobe (EMP), also known as an electron probe microanalyzer (EPMA) or electron micro probe analyzer (EMPA), is an analytical tool used to non-destructively determine the chemical composition of small volumes of solid materials.

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Electron microscope

An electron microscope is a microscope that uses a beam of accelerated electrons as a source of illumination.

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Electron spectrometer

In an electron spectrometer, an incoming beam of electrons is bent with electric or magnetic fields.

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Elmar Zeitler

Elmar Zeitler (12 March 1927) is a German physicist.

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Energy filtered transmission electron microscopy

Energy-filtered transmission electron microscopy (EFTEM) is a technique used in transmission electron microscopy, in which only electrons of particular kinetic energies are used to form the image or diffraction pattern.

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EXC code

EXC is a condensed matter physics many-body theory software package implementing the Bethe–Salpeter equation in frequency-reciprocal space and on a plane wave basis set.

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High resolution electron energy loss spectroscopy

High resolution electron energy loss spectroscopy (HREELS) is a tool used in surface science.

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High-resolution transmission electron microscopy

High-resolution transmission electron microscopy (HRTEM) (or HREM) is an imaging mode of the transmission electron microscope (TEM) that allows for direct imaging of the atomic structure of the sample.

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Hyperspectral imaging

Hyperspectral imaging, like other spectral imaging, collects and processes information from across the electromagnetic spectrum.

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Kramers–Kronig relations

The Kramers–Kronig relations are bidirectional mathematical relations, connecting the real and imaginary parts of any complex function that is analytic in the upper half-plane.

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Lanthanum aluminate-strontium titanate interface

The interface between lanthanum aluminate (LaAlO3) and strontium titanate (SrTiO3) is a notable materials interface because it exhibits properties not found in its constituent materials.

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List of materials analysis methods

List of materials analysis methods.

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List of plasma physics articles

This is a list of plasma physics topics.

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Microscopy Listserver

The Microscopy Listserver is a network based discussion forum giving members of the scientific community a centralized Internet address to which questions/comments/answers in the various fields of Microscopy or Microanalysis can be rapidly distributed to a list of (subscribed) individuals by electronic mail.

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Nanometrology

Nanometrology is a subfield of metrology, concerned with the science of measurement at the nanoscale level.

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Ondrej Krivanek

Ondrej L. Krivanek FRS (born Ondřej Ladislav Křivánek; August 1, 1950) is a Czech/British physicist resident in the United States, and a leading developer of electron-optical instrumentation.

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Peter Schattschneider

Peter Schattschneider (a.o. Univ.Prof. Dipl.-Ing. Mag.rer.nat. Dr.techn.)(born 1950 in Vienna) is an Austrian Physicist and Science-Fiction-Writer, currently a Professor at the Institute of Solid State Physics and a staff member of the USTEM special unit of the Vienna University of Technology.

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Precession electron diffraction

Precession electron diffraction (PED) is a specialized method to collect electron diffraction patterns in a transmission electron microscope (TEM).

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Radiation length

In physics, the radiation length is a characteristic of a material, related to the energy loss of high energy, electromagnetic-interacting particles with it.

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Richard D. Leapman

Richard D. Leapman, Ph.

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Scanning transmission electron microscopy

A scanning transmission electron microscope (STEM) is a type of transmission electron microscope (TEM).

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Scanning transmission X-ray microscopy

Scanning transmission X-ray microscopy (STXM) is a type of X-ray microscopy in which a zone plate focuses an X-ray beam onto a small spot, a sample is scanned in the focal plane of the zone plate and the transmitted X-ray intensity is recorded as a function of the sample position.

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Semiconductor characterization techniques

The purpose of this article is to summarize the methods used to experimentally characterize a semiconductor material or device (PN junction, Schottky diode, etc.). Some examples of semiconductor quantities that could be characterized include depletion width, carrier concentration, optical generation and recombination rate, carrier lifetimes, defect concentration, trap states, etc.

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Soquelec

Soquelec (société québécoise d'électronique) limited is a Montreal-based company that focuses on sales and service of scientific equipment for applications in materials and life sciences.

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Spectroscopy

Spectroscopy is the study of the interaction between matter and electromagnetic radiation.

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Spectrum

A spectrum (plural spectra or spectrums) is a condition that is not limited to a specific set of values but can vary, without steps, across a continuum.

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Spin wave

Spin waves are propagating disturbances in the ordering of magnetic materials.

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Surface phonon

In solid state physics, a surface phonon is the quantum of a lattice vibration mode associated with a solid surface.

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Surface science

Surface science is the study of physical and chemical phenomena that occur at the interface of two phases, including solid–liquid interfaces, solid–gas interfaces, solid–vacuum interfaces, and liquid–gas interfaces.

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Sylvia T. Ceyer

Sylvia Teresse Ceyer is a professor of chemistry at MIT, holding the John C. Sheehan Chair in Chemistry.

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Transmission electron microscopy

Transmission electron microscopy (TEM, also sometimes conventional transmission electron microscopy or CTEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image.

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YAMBO code

Yambo is a computer software package for studying many-body theory aspects of solids and molecule systems.

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Redirects here:

EELS, Edge loss near edge spectroscopy.

References

[1] https://en.wikipedia.org/wiki/Electron_energy_loss_spectroscopy

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