11 relations: Electron energy loss spectroscopy, Electron microscope, Electron spectrometer, High-resolution transmission electron microscopy, Index of energy articles, List of materials analysis methods, List of plasma physics articles, Paul Midgley, Richard D. Leapman, Scanning transmission electron microscopy, Transmission electron microscopy.
In electron energy loss spectroscopy (EELS) a material is exposed to a beam of electrons with a known, narrow range of kinetic energies.
An electron microscope is a microscope that uses a beam of accelerated electrons as a source of illumination.
In an electron spectrometer, an incoming beam of electrons is bent with electric or magnetic fields.
High-resolution transmission electron microscopy (HRTEM) (or HREM) is an imaging mode of the transmission electron microscope (TEM) that allows for direct imaging of the atomic structure of the sample.
This is an index of energy articles.
List of materials analysis methods.
This is a list of plasma physics topics.
Paul Anthony Midgley (born 1966) FRS is a Professor of Materials Science in the Department of Materials Science and Metallurgy at the University of Cambridge and a fellow of Peterhouse, Cambridge.
Richard D. Leapman, Ph.
A scanning transmission electron microscope (STEM) is a type of transmission electron microscope (TEM).
Transmission electron microscopy (TEM, also sometimes conventional transmission electron microscopy or CTEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image.